In order to maximize yield, IC design companies spend a lot of effort to analyze what types of design styles are needed and used in their layouts (standard cells, macros, routing layers, and so forth) ...

Time series analysis forms an essential part of modern data science by examining sequential data to unravel the underlying dynamics of complex systems. In particular, entropy-based measures quantify ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.