Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...

Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Two companies have joined forces to optimize quality, integrity, post-programming validation, and cost for embedded test of reprogrammable logic cores. The increasing complexity of system-on-a-chip ...