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PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...

Congenital heart defects (CHDs) are among the most common birth defects, affecting nearly 1 in 100 babies born in the U.S. Yet despite advances in prenatal imaging, CHD remains one of the most ...

WILMINGTON, N.C. (WECT) - February is Heart Health Month and next week begins Congenital Heart Defect Awareness Month. Dr. Lance Lewis, a cardiologist with Novant Health, was in the studio to discuss ...

A production-ready AI vision system for real-time defect detection and classification in manufacturing environments. Achieves >95% accuracy with <100ms latency on edge hardware (NVIDIA Jetson, RTX).

The system, developed by Panevo, a Canadian clear technology and manufacturing analytics company, reportedly achieved approximately 97% detection reliability with minimal false positives of Muskoka’s ...

本文将介绍一种基于改进YOLOv8模型的混凝土结构裂缝识别与损伤区域定位方法。我们引入了CSP（Cross Stage Partial）结构和PTB ...